Guido Bertoni3, Joan Daemen2, Seth Hoffert, Michaël Peeters1, Gilles Van Assche1 and Ronny Van Keer1
1STMicroelectronics - 2Radboud University - 3Security Pattern
The figures above are available under the Creative Commons Attribution 4.0 International License. In short, they can be freely used, but we kindly ask to do the attribution in the figure caption, either by linking to this webpage or by citing the article where the particular figure first appeared.